mike_w/semiconductor-wafer-map-defective-type-classification
图5 黑点为inkcp(circuit probing)也叫"wafer probe"或者"die sort"
当你的单个die的面积变大,本身wafer的面积和造价是固定的
wafermap-swt
图片内容是:wafermap
晶圆产能供不应求将导致价格大幅度上升
(nand flash wafer(闪存晶圆))
hypersonic inc company
automated wafer defect inspection system using backside
occasionally a lot equals 25 wafers. 3.2 wafe